Literature DB >> 19955612

Fast switching behavior of nanoscale Ag6In5Sb59Te30 based nanopillar type phase change memory.

Sung-Hoon Hong1, Byeong-Ju Bae, Heon Lee.   

Abstract

Ag and In co-doped SbTe phase change material (AgInSbTe) was used to fabricate nanopillar phase change memory. The AgInSbTe nanopillar type phase change device with 200 nm of diameter was fabricated by nanoimprint lithography and was reversibly changed between the resistances of 10(4) and 10(6) Omega by applying set/reset pulses using conducting atomic force microscopy. Due to the fast crystallization nature of AgInSbTe, the set operation of the device could be done with only 50 ns of set pulse. The fast crystallization nature of AgInSbTe is also responsible for the decrease in reset voltage of devices set with a short pulse.

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Year:  2009        PMID: 19955612     DOI: 10.1088/0957-4484/21/2/025703

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  1 in total

1.  How fragility makes phase-change data storage robust: insights from ab initio simulations.

Authors:  Wei Zhang; Ider Ronneberger; Peter Zalden; Ming Xu; Martin Salinga; Matthias Wuttig; Riccardo Mazzarello
Journal:  Sci Rep       Date:  2014-10-06       Impact factor: 4.379

  1 in total

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