| Literature DB >> 19923649 |
Jung Inn Sohn1, Woong-Ki Hong, Mi Jung Lee, Takhee Lee, Henning Sirringhaus, Dae Joon Kang, Mark E Welland.
Abstract
We demonstrate the effect of surface chemical dynamics on carrier transport and recombination processes of electron-hole pairs in ZnO nanowire field effect transistors. We have found that the electrical conductance decreases and the threshold voltages shift in a positive gate voltage direction, as electrical characteristics are measured repeatedly. We associate this with the enhancement of oxygen adsorption by capturing electrons from the induced current during the probing. This results in an overall depletion of electrons and thus causes the positive shift in threshold voltages associated with the origin and width of characteristic hysteresis loops. In addition, the surface environment dependence of the photo-response related to a recombination process in ZnO nanowires is discussed in terms of the surface chemical reaction and band bending.Entities:
Year: 2009 PMID: 19923649 DOI: 10.1088/0957-4484/20/50/505202
Source DB: PubMed Journal: Nanotechnology ISSN: 0957-4484 Impact factor: 3.874