| Literature DB >> 19916417 |
Yibin Li1, Sam Zhang, Y Liu, T P Chen, Thirumany Sritharan, Cong Xu.
Abstract
In this paper, we developed nc-Al/a-Al2O3 nanocomposite thin films using magnetron sputtering. The nc-Al/a-Al2O3 films were sputtered on p-type Si substrates from pure Al target in gas mixture of Ar and O2. X-ray photoelectron spectroscopy and high resolution transmission electron microscope studies confirm that the nanocrystalline Al are embedded in amorphous Al2O3 matrix thus nc-Al/ a-Al2O3 nanocomposite forms. This nanocomposite thin film exhibits memory effect as a result of charge trapping.Entities:
Year: 2009 PMID: 19916417 DOI: 10.1166/jnn.2009.m19
Source DB: PubMed Journal: J Nanosci Nanotechnol ISSN: 1533-4880