Literature DB >> 19860962

EELS of niobium and stoichiometric niobium-oxide phases--Part I: plasmon and near-edges fine structure.

David Bach1, Reinhard Schneider, Dagmar Gerthsen, Jo Verbeeck, Wilfried Sigle.   

Abstract

A comprehensive electron energy-loss spectroscopy study of niobium (Nb) and stable Nb-oxide phases (NbO, NbO2, Nb2O5) was carried out. In this work (Part I), the plasmons and energy-loss near-edge structures (ELNES) of all relevant Nb edges (Nb-N2,3, Nb-M4,5, Nb-M2,3, Nb-M1, and Nb-L2,3) up to energy losses of about 2600 eV and the O-K edge are analyzed with respect to achieving characteristic fingerprints of Nb in different formal oxidation states (0 for metallic Nb, +2 for NbO, +4 for NbO2, and +5 for Nb2O5). Chemical shifts of the Nb-N2,3, Nb-M4,5, Nb-M2,3, and Nb-L2,3 edges are extracted from the spectra that amount to about 4 eV as the oxidation state increases from 0 for Nb to +5 for Nb2O5. Four different microscopes, including a 200 keV ZEISS Libra with monochromator, were used. The corresponding wide range of experimental parameters with respect to the primary electron energy, convergence, and collection semi-angles as well as energy resolution allows an assessment of the influence of the experimental setup on the ELNES of the different edges. Finally, the intensity of the Nb-L2,3 white-line edges is correlated with niobium 4d-state occupancy in the different reference materials.

Entities:  

Year:  2009        PMID: 19860962     DOI: 10.1017/S143192760999105X

Source DB:  PubMed          Journal:  Microsc Microanal        ISSN: 1431-9276            Impact factor:   4.127


  2 in total

1.  Electron localization in a mixed-valence diniobium benzene complex.

Authors:  Thomas L Gianetti; Grégory Nocton; Stefan G Minasian; Nikolas Kaltsoyannis; A L David Kilcoyne; Stosh A Kozimor; David K Shuh; Tolek Tyliszczak; Robert G Bergman; John Arnold
Journal:  Chem Sci       Date:  2014-11-11       Impact factor: 9.825

2.  EELS at very high energy losses.

Authors:  Ian MacLaren; Kirsty J Annand; Colin Black; Alan J Craven
Journal:  Microscopy (Oxf)       Date:  2018-03-01       Impact factor: 1.571

  2 in total

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