Literature DB >> 19844023

X-ray pair distribution function analysis of nanostructured materials using a Mythen detector.

Richard G Haverkamp1, Kia S Wallwork.   

Abstract

Total scattering from nanocrystalline materials recorded on the Australian Synchrotron powder diffraction beamline has been analysed to produce atomic pair distribution functions (PDFs) for structural analysis. The capability of this beamline, which uses the massively parallel Mythen II detector, has been quantified with respect to PDF structure analysis. Data were recorded to a wavevector magnitude, Q, of 20.5 A(-1), with successful PDFs obtained for counting times as short as 10 s for crystalline LaB(6) and 180 s for nanocrystalline (47 A) anatase. This paper describes the aspects of a PDF experiment that are crucial to its success, with reference to the outcomes of analysis of data collected from nanocrystalline TiO(2) and microcrystalline LaB(6) and IrO(2).

Entities:  

Year:  2009        PMID: 19844023     DOI: 10.1107/S0909049509036723

Source DB:  PubMed          Journal:  J Synchrotron Radiat        ISSN: 0909-0495            Impact factor:   2.616


  4 in total

1.  Fast continuous measurement of synchrotron powder diffraction synchronized with controlling gas and vapour pressures at beamline BL02B2 of SPring-8.

Authors:  Shogo Kawaguchi; Michitaka Takemoto; Hideki Tanaka; Shotaro Hiraide; Kunihisa Sugimoto; Yoshiki Kubota
Journal:  J Synchrotron Radiat       Date:  2020-03-16       Impact factor: 2.616

Review 2.  Structural Analysis of Molecular Materials Using the Pair Distribution Function.

Authors:  Maxwell W Terban; Simon J L Billinge
Journal:  Chem Rev       Date:  2021-11-17       Impact factor: 60.622

3.  The MYTHEN detector for X-ray powder diffraction experiments at the Swiss Light Source.

Authors:  Anna Bergamaschi; Antonio Cervellino; Roberto Dinapoli; Fabia Gozzo; Beat Henrich; Ian Johnson; Philipp Kraft; Aldo Mozzanica; Bernd Schmitt; Xintian Shi
Journal:  J Synchrotron Radiat       Date:  2010-07-22       Impact factor: 2.616

4.  A statistical approach to correct X-ray response non-uniformity in microstrip detectors for high-accuracy and high-resolution total-scattering measurements.

Authors:  Kenichi Kato; Yoshihito Tanaka; Miho Yamauchi; Koji Ohara; Takaki Hatsui
Journal:  J Synchrotron Radiat       Date:  2019-04-05       Impact factor: 2.616

  4 in total

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