Literature DB >> 19810748

Thermoelectric effect across the metal-insulator domain walls in VO2 microbeams.

J Cao1, W Fan, H Zheng, J Wu.   

Abstract

We report on measurements of Seebeck effect in single-crystal VO(2) microbeams across their metal-insulator phase transition. One-dimensionally aligned metal-insulator domain walls were reversibly created and eliminated along single VO(2) beams by varying temperature, which allows for accurate extraction of the net contribution to the Seebeck effect from these domain walls. We observed significantly lower Seebeck coefficient in the metal-insulator coexisting regime than predicted by a linear combination of contributions from the insulator and metal domains. This indicates that the net contribution of the domain walls has an opposite sign from that of the insulator and metal phases separately. Possible origins that may be responsible for this unexpected effect were discussed in the context of complications in this correlated electron material.

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Year:  2009        PMID: 19810748     DOI: 10.1021/nl902167b

Source DB:  PubMed          Journal:  Nano Lett        ISSN: 1530-6984            Impact factor:   11.189


  4 in total

1.  Photoresponse of a strongly correlated material determined by scanning photocurrent microscopy.

Authors:  T Serkan Kasırga; Dong Sun; Jae H Park; Jim M Coy; Zaiyao Fei; Xiaodong Xu; David H Cobden
Journal:  Nat Nanotechnol       Date:  2012-10-21       Impact factor: 39.213

2.  Role of microstructures on the M1-M2 phase transition in epitaxial VO2 thin films.

Authors:  Yanda Ji; Yin Zhang; Min Gao; Zhen Yuan; Yudong Xia; Changqing Jin; Bowan Tao; Chonglin Chen; Quanxi Jia; Yuan Lin
Journal:  Sci Rep       Date:  2014-05-06       Impact factor: 4.379

3.  Thermoelectric Seebeck effect in oxide-based resistive switching memory.

Authors:  Ming Wang; Chong Bi; Ling Li; Shibing Long; Qi Liu; Hangbing Lv; Nianduan Lu; Pengxiao Sun; Ming Liu
Journal:  Nat Commun       Date:  2014-08-20       Impact factor: 14.919

4.  Thermal hysteresis measurement of the VO2 emissivity and its application in thermal rectification.

Authors:  C L Gomez-Heredia; J A Ramirez-Rincon; J Ordonez-Miranda; O Ares; J J Alvarado-Gil; C Champeaux; F Dumas-Bouchiat; Y Ezzahri; K Joulain
Journal:  Sci Rep       Date:  2018-05-31       Impact factor: 4.379

  4 in total

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