Literature DB >> 19792386

Understanding the clean interface between covalent Si and ionic Al2O3.

H J Xiang1, Juarez L F Da Silva, Howard M Branz, Su-Huai Wei.   

Abstract

The atomic and electronic structures of the (001)-Si/(001)-gamma-Al(2)O(3) heterointerface are investigated by first principles total energy calculations combined with a newly developed "modified basin-hopping" method. It is found that all interface Si atoms are fourfold coordinated due to the formation of Si-O and unexpected covalent Si-Al bonds in the new abrupt interface model. And the interface has perfect electronic properties in that the unpassivated interface has a large LDA band gap and no gap levels. These results show that it is possible to have clean semiconductor-oxide interfaces.

Entities:  

Year:  2009        PMID: 19792386     DOI: 10.1103/PhysRevLett.103.116101

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  2 in total

1.  A genetic algorithm for predicting the structures of interfaces in multicomponent systems.

Authors:  Alvin L-S Chua; Nicole A Benedek; Lin Chen; Mike W Finnis; Adrian P Sutton
Journal:  Nat Mater       Date:  2010-02-28       Impact factor: 43.841

2.  Electron irradiation induced amorphous SiO2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces.

Authors:  S Gurbán; P Petrik; M Serényi; A Sulyok; M Menyhárd; E Baradács; B Parditka; C Cserháti; G A Langer; Z Erdélyi
Journal:  Sci Rep       Date:  2018-02-01       Impact factor: 4.379

  2 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.