Literature DB >> 19773787

Scanning electron microscopy: Second best no more.

David C Joy.   

Abstract

Year:  2009        PMID： 19773787     DOI： 10.1038/nmat2538

Source DB:  PubMed          Journal:  Nat Mater        ISSN： 1476-1122            Impact factor:   43.841


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  1 in total

1.  Imaging single atoms using secondary electrons with an aberration-corrected electron microscope.

Authors:  Y Zhu; H Inada; K Nakamura; J Wall
Journal:  Nat Mater       Date:  2009-09-20       Impact factor: 43.841
  1 in total
  2 in total

1.  FIB/SEM tomography with TEM-like resolution for 3D imaging of high-pressure frozen cells.

Authors:  Clarissa Villinger; Heiko Gregorius; Christine Kranz; Katharina Höhn; Christin Münzberg; Götz von Wichert; Boris Mizaikoff; Gerhard Wanner; Paul Walther
Journal:  Histochem Cell Biol       Date:  2012-08-25       Impact factor: 4.304

2.  Sub-nanometre resolution imaging of polymer-fullerene photovoltaic blends using energy-filtered scanning electron microscopy.

Authors:  Robert C Masters; Andrew J Pearson; Tom S Glen; Fabian-Cyril Sasam; Letian Li; Maurizio Dapor; Athene M Donald; David G Lidzey; Cornelia Rodenburg
Journal:  Nat Commun       Date:  2015-04-24       Impact factor: 14.919
  2 in total

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