Literature DB >> 19752890

Absolute optical ranging with 200-nm resolution.

C C Williams, H K Wickramasinghe.   

Abstract

Absolute optical ranging has been demonstrated by wavelength-multiplexed interferometry with a range resolution of 200 nm, well below the single-wavelength ambiguity. Two current- and temperature-tunable GaAlAs laser diodes (850 nm) provide an equivalent wavelength below 100 microm and a resolution of less than 200 nm. The achievement of such resolution provides the means for combining single- and multiple-wavelength interferometric measurements to achieve unambiguous distance measurement with nanometer resolution. The ranging system is also used to profile unambiguously an integrated circuit structure with a 2.5-microm surface topography.

Year:  1989        PMID: 19752890     DOI: 10.1364/ol.14.000542

Source DB:  PubMed          Journal:  Opt Lett        ISSN: 0146-9592            Impact factor:   3.776


  2 in total

1.  Error Analysis and Modeling for an Absolute Capacitive Displacement Measuring System with High Accuracy and Long Range.

Authors:  Dongdong Zhang; Li Lin; Quanshui Zheng
Journal:  Sensors (Basel)       Date:  2019-12-04       Impact factor: 3.576

2.  Real-Time and Meter-Scale Absolute Distance Measurement by Frequency-Comb-Referenced Multi-Wavelength Interferometry.

Authors:  Guochao Wang; Lilong Tan; Shuhua Yan
Journal:  Sensors (Basel)       Date:  2018-02-07       Impact factor: 3.576

  2 in total

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