Literature DB >> 19662004

Force microscopy: on the charge.

Udo D Schwarz1.   

Abstract

The atomic force microscope has recently been the subject of a series of exciting developments. The latest advance shows that this instrument can measure the charge state of an individual atom.

Year:  2009        PMID： 19662004     DOI： 10.1038/nnano.2009.215

Source DB:  PubMed          Journal:  Nat Nanotechnol        ISSN： 1748-3387            Impact factor:   39.213


  9 in total

1.  Observation of single charge carriers by force microscopy.

Authors: 
Journal:  Phys Rev Lett       Date:  1990-12-17       Impact factor: 9.161

2.  Atomic force microscope.

Authors: 
Journal:  Phys Rev Lett       Date:  1986-03-03       Impact factor: 9.161

3.  Atom inlays performed at room temperature using atomic force microscopy.

Authors:  Yoshiaki Sugimoto; Masayuki Abe; Shinji Hirayama; Noriaki Oyabu; Oscar Custance; Seizo Morita
Journal:  Nat Mater       Date:  2005-01-16       Impact factor: 43.841

4.  Chemical identification of individual surface atoms by atomic force microscopy.

Authors:  Yoshiaki Sugimoto; Pablo Pou; Masayuki Abe; Pavel Jelinek; Rubén Pérez; Seizo Morita; Oscar Custance
Journal:  Nature       Date:  2007-03-01       Impact factor: 49.962

5.  The force needed to move an atom on a surface.

Authors:  Markus Ternes; Christopher P Lutz; Cyrus F Hirjibehedin; Franz J Giessibl; Andreas J Heinrich
Journal:  Science       Date:  2008-02-22       Impact factor: 47.728

6.  Magnetic exchange force microscopy with atomic resolution.

Authors:  Uwe Kaiser; Alexander Schwarz; Roland Wiesendanger
Journal:  Nature       Date:  2007-03-29       Impact factor: 49.962

7.  Three-dimensional imaging of short-range chemical forces with picometre resolution.

Authors:  Boris J Albers; Todd C Schwendemann; Mehmet Z Baykara; Nicolas Pilet; Marcus Liebmann; Eric I Altman; Udo D Schwarz
Journal:  Nat Nanotechnol       Date:  2009-04-06       Impact factor: 39.213

8.  Complex patterning by vertical interchange atom manipulation using atomic force microscopy.

Authors:  Yoshiaki Sugimoto; Pablo Pou; Oscar Custance; Pavel Jelinek; Masayuki Abe; Ruben Perez; Seizo Morita
Journal:  Science       Date:  2008-10-17       Impact factor: 47.728

9.  Measuring the charge state of an adatom with noncontact atomic force microscopy.

Authors:  Leo Gross; Fabian Mohn; Peter Liljeroth; Jascha Repp; Franz J Giessibl; Gerhard Meyer
Journal:  Science       Date:  2009-06-12       Impact factor: 47.728
  9 in total

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