| Literature DB >> 19659177 |
J Seifert1, D Blauth, H Winter.
Abstract
The structure of a monolayer silica film on a Mo(112) surface is investigated by grazing scattering of 25 keV H0 atoms. By detection of the number of projectile induced emitted electrons as function of azimuthal angle of rotation of the target surface, the geometrical structure of atoms forming the topmost layer of the silica film is determined via ion beam triangulation. From our data we find evidence for the arrangement of surface atoms in terms of a two-dimensional Si-O-Si network model.Entities:
Year: 2009 PMID: 19659177 DOI: 10.1103/PhysRevLett.103.017601
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161