Literature DB >> 19658849

High-resolution transmission electron microscopy on an absolute contrast scale.

A Thust1.   

Abstract

A fully quantitative approach to high-resolution transmission electron microscopy requires a satisfactory match between image simulations and experiments. While almost perfect agreement between simulations and experiments is routinely achieved on a relative contrast level, a huge mutual discrepancy in the absolute image contrast by a factor of 3 has been frequently reported. It is shown that a major reason for this well-known contrast discrepancy, which is often called Stobbs-factor problem, lies in the neglect of the detector modulation-transfer function in image simulations.

Year:  2009        PMID: 19658849     DOI: 10.1103/PhysRevLett.102.220801

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  8 in total

1.  Experimental analysis of charge redistribution due to chemical bonding by high-resolution transmission electron microscopy.

Authors:  Jannik C Meyer; Simon Kurasch; Hye Jin Park; Viera Skakalova; Daniela Künzel; Axel Gross; Andrey Chuvilin; Gerardo Algara-Siller; Siegmar Roth; Takayuki Iwasaki; Ulrich Starke; Jurgen H Smet; Ute Kaiser
Journal:  Nat Mater       Date:  2011-01-16       Impact factor: 43.841

2.  Electron microscopy: Shape of a crystal from one image.

Authors:  Leslie J Allen
Journal:  Nat Mater       Date:  2014-11       Impact factor: 43.841

3.  Determination of the 3D shape of a nanoscale crystal with atomic resolution from a single image.

Authors:  C L Jia; S B Mi; J Barthel; D W Wang; R E Dunin-Borkowski; K W Urban; A Thust
Journal:  Nat Mater       Date:  2014-09-21       Impact factor: 43.841

4.  Dark-field transmission electron microscopy and the Debye-Waller factor of graphene.

Authors:  Brian Shevitski; Matthew Mecklenburg; William A Hubbard; E R White; Ben Dawson; M S Lodge; Masa Ishigami; B C Regan
Journal:  Phys Rev B Condens Matter Mater Phys       Date:  2013-01-15

5.  Simulation of bonding effects in HRTEM images of light element materials.

Authors:  Simon Kurasch; Jannik C Meyer; Daniela Künzel; Axel Groß; Ute Kaiser
Journal:  Beilstein J Nanotechnol       Date:  2011-07-19       Impact factor: 3.649

6.  Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector.

Authors:  Jiamei Song; Christopher S Allen; Si Gao; Chen Huang; Hidetaka Sawada; Xiaoqing Pan; Jamie Warner; Peng Wang; Angus I Kirkland
Journal:  Sci Rep       Date:  2019-03-08       Impact factor: 4.379

7.  Vacancy driven surface disorder catalyzes anisotropic evaporation of ZnO (0001) polar surface.

Authors:  Zhen Wang; Jinho Byun; Subin Lee; Jinsol Seo; Bumsu Park; Jong Chan Kim; Hu Young Jeong; Junhyeok Bang; Jaekwang Lee; Sang Ho Oh
Journal:  Nat Commun       Date:  2022-09-24       Impact factor: 17.694

8.  Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles.

Authors:  Jacob Madsen; Pei Liu; Jakob B Wagner; Thomas W Hansen; Jakob Schiøz
Journal:  Adv Struct Chem Imaging       Date:  2017-10-25
  8 in total

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