Literature DB >> 19546144

STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun.

Hidetaka Sawada1, Yasumasa Tanishiro, Nobuhiro Ohashi, Takeshi Tomita, Fumio Hosokawa, Toshikatsu Kaneyama, Yukihito Kondo, Kunio Takayanagi.   

Abstract

A spherical aberration-corrected electron microscope has been developed recently, which is equipped with a 300-kV cold field emission gun and an objective lens of a small chromatic aberration coefficient. A dumbbell image of 47 pm spacing, corresponding to a pair of atomic columns of germanium aligned along the [114] direction, is resolved in high-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) with a 0.4-eV energy spread of the electron beam. The observed image was compared with a simulated image obtained by dynamical calculation.

Mesh:

Year:  2009        PMID: 19546144     DOI: 10.1093/jmicro/dfp030

Source DB:  PubMed          Journal:  J Electron Microsc (Tokyo)        ISSN: 0022-0744


  11 in total

1.  Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy.

Authors:  Ryo Ishikawa; Eiji Okunishi; Hidetaka Sawada; Yukihito Kondo; Fumio Hosokawa; Eiji Abe
Journal:  Nat Mater       Date:  2011-02-13       Impact factor: 43.841

2.  Microscopy: Hasten high resolution.

Authors:  Stephen J Pennycook; Sergei V Kalinin
Journal:  Nature       Date:  2014-11-27       Impact factor: 49.962

Review 3.  Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials.

Authors:  Xiaoxing Ke; Carla Bittencourt; Gustaaf Van Tendeloo
Journal:  Beilstein J Nanotechnol       Date:  2015-07-16       Impact factor: 3.649

4.  Atomic structure from large-area, low-dose exposures of materials: a new route to circumvent radiation damage.

Authors:  J C Meyer; J Kotakoski; C Mangler
Journal:  Ultramicroscopy       Date:  2013-12-01       Impact factor: 2.689

5.  Electron Ptychographic Diffractive Imaging of Boron Atoms in LaB6 Crystals.

Authors:  Peng Wang; Fucai Zhang; Si Gao; Mian Zhang; Angus I Kirkland
Journal:  Sci Rep       Date:  2017-06-06       Impact factor: 4.379

6.  Sub-2 Angstrom resolution structure determination using single-particle cryo-EM at 200 keV.

Authors:  Mengyu Wu; Gabriel C Lander; Mark A Herzik
Journal:  J Struct Biol X       Date:  2020-02-28

7.  Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector.

Authors:  Jiamei Song; Christopher S Allen; Si Gao; Chen Huang; Hidetaka Sawada; Xiaoqing Pan; Jamie Warner; Peng Wang; Angus I Kirkland
Journal:  Sci Rep       Date:  2019-03-08       Impact factor: 4.379

8.  High temporal-resolution scanning transmission electron microscopy using sparse-serpentine scan pathways.

Authors:  Eduardo Ortega; Daniel Nicholls; Nigel D Browning; Niels de Jonge
Journal:  Sci Rep       Date:  2021-11-22       Impact factor: 4.379

9.  Big Data Analytics for Scanning Transmission Electron Microscopy Ptychography.

Authors:  S Jesse; M Chi; A Belianinov; C Beekman; S V Kalinin; A Y Borisevich; A R Lupini
Journal:  Sci Rep       Date:  2016-05-23       Impact factor: 4.379

10.  Electron ptychographic microscopy for three-dimensional imaging.

Authors:  Si Gao; Peng Wang; Fucai Zhang; Gerardo T Martinez; Peter D Nellist; Xiaoqing Pan; Angus I Kirkland
Journal:  Nat Commun       Date:  2017-07-31       Impact factor: 14.919

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