| Literature DB >> 19545125 |
Antje Schaarschmidt, Abdiaziz A Farah, Arun Aby, Amr S Helmy.
Abstract
The effect of nonadiabatic annealing on poly(3,4-ethylendioxythiophene)-poly(styrenesulfonate) (PEDOT-PSS) thin films prepared on silicon substrate has been investigated by Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM). The analysis indicates the formation of an annealing-induced doping in PEDOT structure, suggesting a modification of the polymer electronic structure and the formation of a PEDOT-rich film surface.Entities:
Year: 2009 PMID: 19545125 DOI: 10.1021/jp904147v
Source DB: PubMed Journal: J Phys Chem B ISSN: 1520-5207 Impact factor: 2.991