| Literature DB >> 19529743 |
P Albella1, J M Saiz, J M Sanz, F González, F Moreno.
Abstract
We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe-surface distance or in the refractive index of the surface.Year: 2009 PMID： 19529743 DOI： 10.1364/ol.34.001906
Source DB: PubMed Journal: Opt Lett ISSN： 0146-9592 Impact factor: 3.776