| Literature DB >> 19516821 |
T M Bloomstein, Michael F Marchant, Sandra Deneault, Dennis E Hardy, Mordechai Rothschild.
Abstract
Immersion interference lithography was used to pattern gratings with 22-nm half pitch. This ultrahigh resolution was made possible by using 157-nm light, a sapphire coupling prism with index 2.09, and a 30-nm-thick immersion fluid with index 1.82. The thickness was controlled precisely by spin-casting the fluid rather than through mechanical means. The photoresist was a diluted version of a 193-nm material, which had a 157-nm index of 1.74. An analysis of the trade-off between fluid index, absorption coefficient, gap size and throughput indicated that, among the currently available materials, employing a high-index but absorbing fluid is preferable to using a highly transparent but low-index immersion media.Year: 2006 PMID: 19516821 DOI: 10.1364/oe.14.006434
Source DB: PubMed Journal: Opt Express ISSN: 1094-4087 Impact factor: 3.894