Literature DB >> 19516821

22-nm immersion interference lithography.

T M Bloomstein, Michael F Marchant, Sandra Deneault, Dennis E Hardy, Mordechai Rothschild.   

Abstract

Immersion interference lithography was used to pattern gratings with 22-nm half pitch. This ultrahigh resolution was made possible by using 157-nm light, a sapphire coupling prism with index 2.09, and a 30-nm-thick immersion fluid with index 1.82. The thickness was controlled precisely by spin-casting the fluid rather than through mechanical means. The photoresist was a diluted version of a 193-nm material, which had a 157-nm index of 1.74. An analysis of the trade-off between fluid index, absorption coefficient, gap size and throughput indicated that, among the currently available materials, employing a high-index but absorbing fluid is preferable to using a highly transparent but low-index immersion media.

Year:  2006        PMID: 19516821     DOI: 10.1364/oe.14.006434

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  3 in total

1.  Batch Fabrication of Broadband Metallic Planar Microlenses and Their Arrays Combining Nanosphere Self-Assembly with Conventional Photolithography.

Authors:  Ping Wang; Xiaochang Yu; Yechuan Zhu; Yiting Yu; Weizheng Yuan
Journal:  Nanoscale Res Lett       Date:  2017-06-02       Impact factor: 4.703

2.  Direct Laser Interference Ink Printing Using Copper Metal-Organic Decomposition Ink for Nanofabrication.

Authors:  Jun-Han Park; Jung-Woon Lee; Yong-Won Ma; Bo-Seok Kang; Sung-Moo Hong; Bo-Sung Shin
Journal:  Nanomaterials (Basel)       Date:  2022-01-25       Impact factor: 5.076

Review 3.  Chemical interactions and their role in the microphase separation of block copolymer thin films.

Authors:  Richard A Farrell; Thomas G Fitzgerald; Dipu Borah; Justin D Holmes; Michael A Morris
Journal:  Int J Mol Sci       Date:  2009-08-25       Impact factor: 6.208

  3 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.