Literature DB >> 19498945

Magnification variations due to illumination curvature and object defocus in transmission electron microscopy.

Gijs van Duinen, Marin van Heel, Ardan Patwardhan.   

Abstract

It has previously been shown that - in theory - magnification variations can occur in an imaging system as a function of defocus, depending on the field curvature of the illuminating system. We here present the results of practical experiments to verify this effect in the transmission electron microscope. We find that with illumination settings typically used in the electron microscopy of biological macromolecules, systematic variations in magnification of ~ 0.5% per microm defocus can easily occur. This work highlights the need for a magnification-invariant imaging mode to eliminate or to compensate for this effect.

Year:  2005        PMID: 19498945     DOI: 10.1364/opex.13.009085

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  3 in total

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Review 2.  Limiting factors in atomic resolution cryo electron microscopy: no simple tricks.

Authors:  Xing Zhang; Z Hong Zhou
Journal:  J Struct Biol       Date:  2011-05-24       Impact factor: 2.867

3.  Contrast transfer function correction applied to cryo-electron tomography and sub-tomogram averaging.

Authors:  Giulia Zanetti; James D Riches; Stephen D Fuller; John A G Briggs
Journal:  J Struct Biol       Date:  2009-08-08       Impact factor: 2.867

  3 in total

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