Literature DB >> 19494930

Profilometry with line-field Fourier-domain interferometry.

Takashi Endo, Yoshiaki Yasuno, Shuichi Makita, Masahide Itoh, Toyohiko Yatagai.   

Abstract

Line-field Fourier-domain interferometry that is capable of a fast three-dimensional (3-D) shape measurement is proposed. This system is constructed from a combination of a conventional Fourier-domain interferometer and a one-dimensional imaging system. This system directs a line-shaped focus onto a specimen, and a two-dimensional shape can be calculated from a single-shot image of the CCD camera without any mechanical scan. An aspherical mirror and a Japanese coin are presented as a 3-D shape measurement example.

Year:  2005        PMID: 19494930     DOI: 10.1364/opex.13.000695

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  2 in total

1.  Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing.

Authors:  Zahid Yaqoob; Wonshik Choi; Seungeun Oh; Niyom Lue; Yongkeun Park; Christopher Fang-Yen; Ramachandra R Dasari; Kamran Badizadegan; Michael S Feld
Journal:  Opt Express       Date:  2009-06-22       Impact factor: 3.894

2.  Double common-path interferometer for flexible optical probe of optical coherence tomography.

Authors:  Jae Seok Park; Zhongping Chen; Myung Yung Jeong; Chang-Seok Kim
Journal:  Opt Express       Date:  2012-01-16       Impact factor: 3.894

  2 in total

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