| Literature DB >> 19487807 |
M D Henry1, S Walavalkar, A Homyk, A Scherer.
Abstract
We introduce using sputtered aluminum oxide (alumina) as a resilient etch mask for fluorinated silicon reactive ion etches. Achieving selectivity of 5000:1 for cryogenic silicon etching and 68:1 for SF(6)/C(4)F(8) silicon etching, we employ this mask for fabrication of high-aspect-ratio silicon micropillars and nanopillars. Nanopillars with diameters ranging from below 50 nm up to several hundred nanometers are etched to heights greater than 2 microm. Micropillars of 5, 10, 20, and 50 microm diameters are etched to heights of over 150 microm with aspect ratios greater than 25. Processing and characterization of the sputtered alumina is also discussed.Entities:
Year: 2009 PMID: 19487807 DOI: 10.1088/0957-4484/20/25/255305
Source DB: PubMed Journal: Nanotechnology ISSN: 0957-4484 Impact factor: 3.874