| Literature DB >> 19485330 |
Gang Liu1, Qi-Dan Ling, Eric Yeow Hwee Teo, Chun-Xiang Zhu, D Siu-Hung Chan, Koon-Gee Neoh, En-Tang Kang.
Abstract
By varying the carbon nanotube (CNT) content in poly(N-vinylcarbazole) (PVK) composite thin films, the electrical conductance behavior of an indium-tin oxide/PVK-CNT/aluminum (ITO/PVK-CNT/Al) sandwich structure can be tuned in a controlled manner. Distinctly different electrical conductance behaviors, such as (i) insulator behavior, (ii) bistable electrical conductance switching effects (write-once read-many-times (WORM) memory effect and rewritable memory effect), and (iii) conductor behavior, are discernible from the current density-voltage characteristics of the composite films. The turn-on voltage of the two bistable conductance switching devices decreases and the ON/OFF state current ratio of the WORM device increases with the increase in CNT content of the composite film. Both the WORM and rewritable devices are stable under a constant voltage stress or a continuous pulse voltage stress, with an ON/OFF state current ratio in excess of 10(3). The conductance switching effects of the composite films have been attributed to electron trapping in the CNTs of the electron-donating/hole-transporting PVK matrix.Year: 2009 PMID: 19485330 DOI: 10.1021/nn900319q
Source DB: PubMed Journal: ACS Nano ISSN: 1936-0851 Impact factor: 15.881