| Literature DB >> 19461850 |
Karena W Chapman, Peter J Chupas, Charles A Kurtz, Darren R Locke, John B Parise, Joseph A Hriljac.
Abstract
The use of a polymeric Torlon (polyamide-imide) gasket material in a Paris-Edinburgh pressure cell for in situ high-pressure X-ray scattering measurements is demonstrated. The relatively low bulk modulus of the gasket allows for fine control of the sample pressure over the range 0.01-0.42 GPa. The quality of the data obtained in this way is suitable for Bragg and pair distribution function analysis.Entities:
Year: 2007 PMID: 19461850 PMCID: PMC2483494 DOI: 10.1107/S0021889806047923
Source DB: PubMed Journal: J Appl Crystallogr ISSN: 0021-8898 Impact factor: 3.304
Figure 1(a) A schematic representation of the sample environment in the PE cell and (b) a diffraction image collected at ambient pressure. The scattered beam is shadowed by the anvils in the x direction (horizontal).
Figure 2The sample pressures generated at various applied pressures. Low-angle diffraction images (top inset) show the diffraction texture which develops for the gasket. A representative Rietveld refinement profile is shown (inset).
Figure 3The pressure dependence of the 220 NaCl reflection (a), measured under non-hydrostatic (b) and near hydrostatic (c) conditions.
Figure 4The reduced structure function [F(Q), (a)] and the pair distribution function [G(r), (b)] obtained for NaCl at 0.42 GPa. The scattering intensities from boron–epoxy and Torlon gaskets are shown (inset).