Literature DB >> 19420576

Quantitative force versus distance measurements in amplitude modulation AFM: a novel force inversion technique.

Allard J Katan1, Maarten H van Es, Tjerk H Oosterkamp.   

Abstract

A new method for extracting quantitative data from amplitude modulation dynamic force-distance measurements is developed. The method is based on the harmonic oscillator model of vibrating atomic force microscope cantilevers, and is capable of extracting both the conservative and dissipative parts of the tip-sample interaction from a measurement of oscillation amplitude and phase as a function of distance. Numerical simulations are used to demonstrate the validity of the method. Further proof of the accuracy of this method is provided by a measurement of electrostatic forces between an AFM tip and a graphite sample.

Entities:  

Year:  2009        PMID: 19420576     DOI: 10.1088/0957-4484/20/16/165703

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  13 in total

1.  Interaction imaging with amplitude-dependence force spectroscopy.

Authors:  Daniel Platz; Daniel Forchheimer; Erik A Tholén; David B Haviland
Journal:  Nat Commun       Date:  2013       Impact factor: 14.919

2.  Fast Stiffness Mapping of Cells Using High-Bandwidth Atomic Force Microscopy.

Authors:  Andrew Wang; Karthik Vijayraghavan; Olav Solgaard; Manish J Butte
Journal:  ACS Nano       Date:  2015-12-15       Impact factor: 15.881

3.  Nanocharacterization of soft biological samples in shear mode with quartz tuning fork probes.

Authors:  Jorge Otero; Laura Gonzalez; Manel Puig-Vidal
Journal:  Sensors (Basel)       Date:  2012-04-12       Impact factor: 3.576

4.  Capillary and van der Waals interactions on CaF2 crystals from amplitude modulation AFM force reconstruction profiles under ambient conditions.

Authors:  Annalisa Calò; Oriol Vidal Robles; Sergio Santos; Albert Verdaguer
Journal:  Beilstein J Nanotechnol       Date:  2015-03-25       Impact factor: 3.649

5.  Accurate, explicit formulae for higher harmonic force spectroscopy by frequency modulation-AFM.

Authors:  Kfir Kuchuk; Uri Sivan
Journal:  Beilstein J Nanotechnol       Date:  2015-01-13       Impact factor: 3.649

Review 6.  Imaging Water Thin Films in Ambient Conditions Using Atomic Force Microscopy.

Authors:  Sergio Santos; Albert Verdaguer
Journal:  Materials (Basel)       Date:  2016-03-09       Impact factor: 3.623

7.  Interpreting motion and force for narrow-band intermodulation atomic force microscopy.

Authors:  Daniel Platz; Daniel Forchheimer; Erik A Tholén; David B Haviland
Journal:  Beilstein J Nanotechnol       Date:  2013-01-21       Impact factor: 3.649

8.  Polynomial force approximations and multifrequency atomic force microscopy.

Authors:  Daniel Platz; Daniel Forchheimer; Erik A Tholén; David B Haviland
Journal:  Beilstein J Nanotechnol       Date:  2013-06-10       Impact factor: 3.649

9.  Peak forces and lateral resolution in amplitude modulation force microscopy in liquid.

Authors:  Horacio V Guzman; Ricardo Garcia
Journal:  Beilstein J Nanotechnol       Date:  2013-12-06       Impact factor: 3.649

10.  Generalized Hertz model for bimodal nanomechanical mapping.

Authors:  Aleksander Labuda; Marta Kocuń; Waiman Meinhold; Deron Walters; Roger Proksch
Journal:  Beilstein J Nanotechnol       Date:  2016-07-05       Impact factor: 3.649

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