Owain Vaughan. Show Affiliations »
Abstract
Mesh: See more » Microscopy, Scanning Probe/methodsMicroscopy, Scanning Probe/trendsMicroscopy, Scanning Tunneling/methodsMicroscopy, Scanning Tunneling/trendsNanostructures/ultrastructureNanotechnology/methodsNanotechnology/trendsSurface Properties
Year: 2009 PMID: 19350026 DOI: 10.1038/nnano.2009.59
Source DB: PubMed Journal: Nat Nanotechnol ISSN: 1748-3387 Impact factor: 39.213