Literature DB >> 19333253

Fabrication and characterization of nanoscale resonant gratings on thin silicon membrane.

Yongjin Wang1, Yoshiaki Kanamori, Jiasheng Ye, Hidehisa Sameshima, Kazuhiro Hane.   

Abstract

We report the design and fabrication of nanoscale resonant gratings which is of interest for narrow bandwidth filtering application. The linear/circular grating structures, of which the grating width is 200nm and the grating height is 260nm, are generated on silicon-on-insulator wafer. Nanoscale gratings are fabricated on the silicon device layer by a combination of electron beam lithography and fast atom beam etching. The silicon handle layer under grating region is removed by deep reactive ion etching, and the buried oxide layer is kept. The reflectance measurements are performed to characterize the optical response of fabricated freestanding nanoscale gratings. The resonant behavior of linear gratings agrees with the theoretical predication, and the polarization-independent responses of circular gratings are also experimentally demonstrated.

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Year:  2009        PMID: 19333253     DOI: 10.1364/oe.17.004938

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  2 in total

1.  Diffractive properties of imaginary-part photonic crystal slab.

Authors:  Haoxiang Jiang; Jing-Feng Liu; Gengyan Chen; Xue-Hua Wang
Journal:  Nanoscale Res Lett       Date:  2012-06-21       Impact factor: 4.703

2.  Freestanding HfO2 grating fabricated by fast atom beam etching.

Authors:  Yongjin Wang; Tong Wu; Yoshiaki Kanamori; Kazuhiro Hane
Journal:  Nanoscale Res Lett       Date:  2011-04-28       Impact factor: 4.703

  2 in total

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