Literature DB >> 19305886

Optical differential reflectance spectroscopy of ultrathin epitaxial organic films.

Roman Forker1, Torsten Fritz.   

Abstract

This Perspective does not have the ambition to entirely review the subject of optical spectroscopy on thin organic films. What we will try to achieve instead is to give an overview on optical reflectance spectroscopy of highly ordered organic thin films in the thickness range from submonolayers to several monolayers, as a tool to study the absorption behavior of such films. By doing so, we will emphasize the relations between the physical layer structure and the resulting optical properties. More specifically, we intend to show on the basis of particular examples what physical effects can be favorably examined by means of real-time optical spectroscopy, i.e., applied during the actual film growth, especially differential reflectance spectroscopy (DRS). Epitaxial organic films on inorganic substrates (insulators and conductors) will be in focus, and also the perspectives of investigating organic-organic heteroepitaxial layers will be addressed.

Entities:  

Year:  2009        PMID: 19305886     DOI: 10.1039/b814628d

Source DB:  PubMed          Journal:  Phys Chem Chem Phys        ISSN: 1463-9076            Impact factor:   3.676


  8 in total

1.  Transformations of PTCDA structures on rutile TiO2 induced by thermal annealing and intermolecular forces.

Authors:  Szymon Godlewski; Jakub S Prauzner-Bechcicki; Thilo Glatzel; Ernst Meyer; Marek Szymoński
Journal:  Beilstein J Nanotechnol       Date:  2015-07-10       Impact factor: 3.649

2.  Flexible 2D Crystals of Polycyclic Aromatics Stabilized by Static Distortion Waves.

Authors:  Matthias Meissner; Falko Sojka; Lars Matthes; Friedhelm Bechstedt; Xinliang Feng; Klaus Müllen; Stefan C B Mannsfeld; Roman Forker; Torsten Fritz
Journal:  ACS Nano       Date:  2016-04-01       Impact factor: 15.881

3.  Influence of Film and Substrate Structure on Photoelectron Momentum Maps of Coronene Thin Films on Ag(111).

Authors:  Christian Udhardt; Felix Otto; Christian Kern; Daniel Lüftner; Tobias Huempfner; Tino Kirchhuebel; Falko Sojka; Matthias Meissner; Bernd Schröter; Roman Forker; Peter Puschnig; Torsten Fritz
Journal:  J Phys Chem C Nanomater Interfaces       Date:  2017-05-11       Impact factor: 4.126

4.  GIDVis: a comprehensive software tool for geometry-independent grazing-incidence X-ray diffraction data analysis and pole-figure calculations.

Authors:  Benedikt Schrode; Stefan Pachmajer; Michael Dohr; Christian Röthel; Jari Domke; Torsten Fritz; Roland Resel; Oliver Werzer
Journal:  J Appl Crystallogr       Date:  2019-05-31       Impact factor: 4.868

5.  Correlation between two- and three-dimensional crystallographic lattices for epitaxial analysis. II. Experimental results.

Authors:  Josef Simbrunner; Jari Domke; Falko Sojka; Andreas Jeindl; Felix Otto; Marco Gruenewald; Oliver T Hofmann; Torsten Fritz; Roland Resel; Roman Forker
Journal:  Acta Crystallogr A Found Adv       Date:  2022-04-11       Impact factor: 2.331

6.  Layer-Resolved Evolution of Organic Thin Films Monitored by Photoelectron Emission Microscopy and Optical Reflectance Spectroscopy.

Authors:  Ebrahim Ghanbari; Thorsten Wagner; Peter Zeppenfeld
Journal:  J Phys Chem C Nanomater Interfaces       Date:  2015-10-01       Impact factor: 4.126

7.  Molecular Reorientation during the Initial Growth of Perfluoropentacene on Ag(110).

Authors:  Andrea Navarro-Quezada; Ebrahim Ghanbari; Thorsten Wagner; Peter Zeppenfeld
Journal:  J Phys Chem C Nanomater Interfaces       Date:  2018-06-01       Impact factor: 4.126

8.  Direct Observation of Monolayer MoS2 Prepared by CVD Using In-Situ Differential Reflectance Spectroscopy.

Authors:  Yina Wang; Lei Zhang; Chenhui Su; Hang Xiao; Shanshan Lv; Faye Zhang; Qingmei Sui; Lei Jia; Mingshun Jiang
Journal:  Nanomaterials (Basel)       Date:  2019-11-19       Impact factor: 5.076

  8 in total

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