Literature DB >> 19257687

Formation of large voids in the amorphous phase-change memory Ge2Sb2Te5 alloy.

Zhimei Sun1, Jian Zhou, Andreas Blomqvist, Börje Johansson, Rajeev Ahuja.   

Abstract

On the basis of ab initio molecular dynamics simulations, large voids mainly surrounded by Te atoms are observed in molten and amorphous Ge2Sb2Te5, which is due to the clustering of two- and threefold coordinated Te atoms. Furthermore, pressure shows a significant effect on the clustering of the under coordinated Te atoms and hence the formation of large voids. The present results demonstrate that both vacancies and Te play an important role in the fast reversible phase transition process.

Year:  2009        PMID: 19257687     DOI: 10.1103/PhysRevLett.102.075504

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  6 in total

1.  Pressure tunes electrical resistivity by four orders of magnitude in amorphous Ge2Sb2Te5 phase-change memory alloy.

Authors:  M Xu; Y Q Cheng; L Wang; H W Sheng; Y Meng; W G Yang; X D Han; E Ma
Journal:  Proc Natl Acad Sci U S A       Date:  2012-04-16       Impact factor: 11.205

2.  Pressure-induced reversible amorphization and an amorphous-amorphous transition in Ge₂Sb₂Te₅ phase-change memory material.

Authors:  Zhimei Sun; Jian Zhou; Yuanchun Pan; Zhitang Song; Ho-Kwang Mao; Rajeev Ahuja
Journal:  Proc Natl Acad Sci U S A       Date:  2011-06-13       Impact factor: 11.205

3.  Phase Separation in Ge-Rich GeSbTe at Different Length Scales: Melt-Quenched Bulk versus Annealed Thin Films.

Authors:  Daniel Tadesse Yimam; A J T Van Der Ree; Omar Abou El Kheir; Jamo Momand; Majid Ahmadi; George Palasantzas; Marco Bernasconi; Bart J Kooi
Journal:  Nanomaterials (Basel)       Date:  2022-05-18       Impact factor: 5.719

4.  Optical Properties and Local Structure Evolution during Crystallization of Ga16Sb84 Alloy.

Authors:  F Dong; Y R Guo; C Qiao; J J Wang; H Shen; W S Su; Y X Zheng; R J Zhang; L Y Chen; S Y Wang; X S Miao; M Xu
Journal:  Sci Rep       Date:  2018-06-25       Impact factor: 4.379

5.  In situ TEM observation of void formation and migration in phase change memory devices with confined nanoscale Ge2Sb2Te5.

Authors:  Sang Ho Oh; Kyungjoon Baek; Sung Kyu Son; Kyung Song; Jang Won Oh; Seung-Joon Jeon; Won Kim; Jong Hee Yoo; Kee Jeung Lee
Journal:  Nanoscale Adv       Date:  2020-05-14

6.  Scandium doping brings speed improvement in Sb2Te alloy for phase change random access memory application.

Authors:  Xin Chen; Yonghui Zheng; Min Zhu; Kun Ren; Yong Wang; Tao Li; Guangyu Liu; Tianqi Guo; Lei Wu; Xianqiang Liu; Yan Cheng; Zhitang Song
Journal:  Sci Rep       Date:  2018-05-01       Impact factor: 4.379

  6 in total

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