| Literature DB >> 19206661 |
Anthoula C Papageorgiou1, Chi L Pang, Qiao Chen, Geoff Thornton.
Abstract
Reduced phases of ultrathin rutile TiO(2)(110) grown on Ni(110) have been characterized with scanning tunneling microscopy and low-energy electron diffraction. Areas of 1 x 2 reconstruction are observed as well as {132} and {121} families of crystallographic shear planes. These phases are assigned by comparison with analogous phases on native rutile TiO(2)(110).Entities:
Year: 2007 PMID: 19206661 DOI: 10.1021/nn700158s
Source DB: PubMed Journal: ACS Nano ISSN: 1936-0851 Impact factor: 15.881