Literature DB >> 19206647

Directed self-assembly of block copolymers for nanolithography: fabrication of isolated features and essential integrated circuit geometries.

Mark P Stoykovich1, Huiman Kang, Kostas Ch Daoulas, Guoliang Liu, Chi-Chun Liu, Juan J de Pablo, Marcus Müller, Paul F Nealey.   

Abstract

Self-assembling block copolymers are of interest for nanomanufacturing due to the ability to realize sub-100 nm dimensions, thermodynamic control over the size and uniformity and density of features, and inexpensive processing. The insertion point of these materials in the production of integrated circuits, however, is often conceptualized in the short term for niche applications using the dense periodic arrays of spots or lines that characterize bulk block copolymer morphologies, or in the long term for device layouts completely redesigned into periodic arrays. Here we show that the domain structure of block copolymers in thin films can be directed to assemble into nearly the complete set of essential dense and isolated patterns as currently defined by the semiconductor industry. These results suggest that block copolymer materials, with their intrinsically advantageous self-assembling properties, may be amenable for broad application in advanced lithography, including device layouts used in existing nanomanufacturing processes.

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Year:  2007        PMID: 19206647     DOI: 10.1021/nn700164p

Source DB:  PubMed          Journal:  ACS Nano        ISSN: 1936-0851            Impact factor:   15.881


  18 in total

1.  Complex self-assembled patterns using sparse commensurate templates with locally varying motifs.

Authors:  Joel K W Yang; Yeon Sik Jung; Jae-Byum Chang; R A Mickiewicz; A Alexander-Katz; C A Ross; Karl K Berggren
Journal:  Nat Nanotechnol       Date:  2010-03-14       Impact factor: 39.213

Review 2.  25th anniversary article: ordered polymer structures for the engineering of photons and phonons.

Authors:  Jae-Hwang Lee; Cheong Yang Koh; Jonathan P Singer; Seog-Jin Jeon; Martin Maldovan; Ori Stein; Edwin L Thomas
Journal:  Adv Mater       Date:  2013-12-12       Impact factor: 30.849

3.  Hierarchical patterns of three-dimensional block-copolymer films formed by electrohydrodynamic jet printing and self-assembly.

Authors:  M Serdar Onses; Chiho Song; Lance Williamson; Erick Sutanto; Placid M Ferreira; Andrew G Alleyne; Paul F Nealey; Heejoon Ahn; John A Rogers
Journal:  Nat Nanotechnol       Date:  2013-08-25       Impact factor: 39.213

4.  Automated Defect and Correlation Length Analysis of Block Copolymer Thin Film Nanopatterns.

Authors:  Jeffrey N Murphy; Kenneth D Harris; Jillian M Buriak
Journal:  PLoS One       Date:  2015-07-24       Impact factor: 3.240

5.  Selective directed self-assembly of coexisting morphologies using block copolymer blends.

Authors:  A Stein; G Wright; K G Yager; G S Doerk; C T Black
Journal:  Nat Commun       Date:  2016-08-02       Impact factor: 14.919

6.  Numerical Simulations of Directed Self-Assembly in Diblock Copolymer Films using Zone Annealing and Pattern Templating.

Authors:  Joseph D Hill; Paul C Millett
Journal:  Sci Rep       Date:  2017-07-12       Impact factor: 4.379

Review 7.  Chemical interactions and their role in the microphase separation of block copolymer thin films.

Authors:  Richard A Farrell; Thomas G Fitzgerald; Dipu Borah; Justin D Holmes; Michael A Morris
Journal:  Int J Mol Sci       Date:  2009-08-25       Impact factor: 6.208

8.  Host-guest self-assembly in block copolymer blends.

Authors:  Woon Ik Park; Yongjoo Kim; Jae Won Jeong; Kyungho Kim; Jung-Keun Yoo; Yoon Hyung Hur; Jong Min Kim; Edwin L Thomas; Alfredo Alexander-Katz; Yeon Sik Jung
Journal:  Sci Rep       Date:  2013-11-12       Impact factor: 4.379

9.  Multilayer block copolymer meshes by orthogonal self-assembly.

Authors:  Amir Tavakkoli K G; Samuel M Nicaise; Karim R Gadelrab; Alfredo Alexander-Katz; Caroline A Ross; Karl K Berggren
Journal:  Nat Commun       Date:  2016-01-22       Impact factor: 14.919

10.  Directed self-assembly of block copolymer films on atomically-thin graphene chemical patterns.

Authors:  Tzu-Hsuan Chang; Shisheng Xiong; Robert M Jacobberger; Solomon Mikael; Hyo Seon Suh; Chi-Chun Liu; Dalong Geng; Xudong Wang; Michael S Arnold; Zhenqiang Ma; Paul F Nealey
Journal:  Sci Rep       Date:  2016-08-16       Impact factor: 4.379

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