Chirality-resolved length analysis of single-walled carbon nanotube samples through shear-aligned photoluminescence anisotropy.

An efficient new method is demonstrated for measuring length distributions of semiconducting single-walled carbon nanotubes (SWCNTs) through analysis of their highly polarized photoluminescence when aligned by shear flows. Instrumentation and procedures are developed to characterize nanotube lengths in bulk suspensions with rapid data acquisition and interpretation. Applying the method with spectrally resolved SWCNT emission provides the first measurements of (n,m)-specific length distributions. A positive correlation is found between average length and nanotube diameter, although this correlation is weaker following extensive sample centrifugation. Intense sonication shortened all nanotube species and had the strongest effect on those with small diameters. The new method should provide a useful alternative to atomic force microscopy for characterizing SWCNT lengths.