Literature DB >> 19199761

Computational study of tunneling transistor based on graphene nanoribbon.

Pei Zhao1, Jyotsna Chauhan, Jing Guo.   

Abstract

Tunneling field-effect transistors (FETs) have been intensely explored recently due to its potential to address power concerns in nanoelectronics. The recently discovered graphene nanoribbon (GNR) is ideal for tunneling FETs due to its symmetric bandstructure, light effective mass, and monolayer-thin body. In this work, we examine the device physics of p-i-n GNR tunneling FETs using atomistic quantum transport simulations. The important role of the edge bond relaxation in the device characteristics is identified. However, the device has ambipolar I-V characteristics, which are not preferred for digital electronics applications. We suggest that using either an asymmetric source-drain doping or a properly designed gate underlap can effectively suppress the ambipolar I-V. A subthreshold slope of 14mV/dec and a significantly improved on-off ratio can be obtained by the p-i-n GNR tunneling FETs.

Entities:  

Year:  2009        PMID: 19199761     DOI: 10.1021/nl803176x

Source DB:  PubMed          Journal:  Nano Lett        ISSN: 1530-6984            Impact factor:   11.189


  3 in total

1.  Scalability assessment of Group-IV mono-chalcogenide based tunnel FET.

Authors:  Madhuchhanda Brahma; Arnab Kabiraj; Dipankar Saha; Santanu Mahapatra
Journal:  Sci Rep       Date:  2018-04-16       Impact factor: 4.379

2.  Short-channel field-effect transistors with 9-atom and 13-atom wide graphene nanoribbons.

Authors:  Juan Pablo Llinas; Andrew Fairbrother; Gabriela Borin Barin; Wu Shi; Kyunghoon Lee; Shuang Wu; Byung Yong Choi; Rohit Braganza; Jordan Lear; Nicholas Kau; Wonwoo Choi; Chen Chen; Zahra Pedramrazi; Tim Dumslaff; Akimitsu Narita; Xinliang Feng; Klaus Müllen; Felix Fischer; Alex Zettl; Pascal Ruffieux; Eli Yablonovitch; Michael Crommie; Roman Fasel; Jeffrey Bokor
Journal:  Nat Commun       Date:  2017-09-21       Impact factor: 14.919

Review 3.  Miniaturization of CMOS.

Authors:  Henry H Radamson; Xiaobin He; Qingzhu Zhang; Jinbiao Liu; Hushan Cui; Jinjuan Xiang; Zhenzhen Kong; Wenjuan Xiong; Junjie Li; Jianfeng Gao; Hong Yang; Shihai Gu; Xuewei Zhao; Yong Du; Jiahan Yu; Guilei Wang
Journal:  Micromachines (Basel)       Date:  2019-04-30       Impact factor: 2.891

  3 in total

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