Visual observation and quantitative measurement of the microwave absorbing effect at X band.

We have set up a two-dimensional spatial field mapping system to measure graphically the quasi-free-space electromagnetic wave in a parallel plate waveguide. Our apparatus illustrates a potential application in characterizing the microwave absorbing materials. From the measured mappings of the microwave field, the visualization of spatial physical process and quantitative characterization of reflectivity coefficients can be achieved. This simple apparatus has a remarkable advantage over with conventional testing methods which usually involve huge, expensive anechoic chambers and demand samples of large size.