Literature DB >> 19105605

Characterization of individual ag nanoparticles and their chemical environment.

Sidhartharaja Rajagopalachary1, Stanislav V Verkhoturov, Emile A Schweikert.   

Abstract

Silver nanoparticles (NPs) of approximately 5 nm diameter deposited in a single layer on glycine were examined with cluster secondary ion mass spectrometry (SIMS) in the event-by-event bombardment-detection mode. The projectiles used were Au(3)(+), C(60)(+), and Au(400)(4+) with impact energies of 34, 26, and 136 keV, respectively. The highest secondary ion yields were obtained with Au(400)(4+). The method presented can test single or multilayer organization and determine surface coverage. NPs are identified one-by-one for chemical composition. Chemical and physical information in a nonimaging mode was resolved at approximately 10 nm. Grazing vs direct impacts on NPs were identified and quantified. NP fragmentation from direct impacts with Au(400)(4+) and C(60)(+) was observed for the first time.

Entities:  

Year:  2009        PMID: 19105605     DOI: 10.1021/ac802188c

Source DB:  PubMed          Journal:  Anal Chem        ISSN: 0003-2700            Impact factor:   6.986


  4 in total

1.  Characterization and quantification of biological micropatterns using Cluster-SIMS.

Authors:  Li-Jung Chen; Sunny S Shah; Stanislav V Verkhoturov; Alexander Revzin; Emile A Schweikert
Journal:  Surf Interface Anal       Date:  2011       Impact factor: 1.607

2.  Characterization and Quantification of Nanoparticle-Antibody Conjugates on Cells Using C(60) ToF SIMS in the Event-By-Event Bombardment/Detection Mode.

Authors:  Li-Jung Chen; Sunny S Shah; Jaime Silangcruz; Michael J Eller; Stanislav V Verkhoturov; Alexander Revzin; Emile A Schweikert
Journal:  Int J Mass Spectrom       Date:  2011-06-01       Impact factor: 1.986

3.  Quantitative label-free characterization of avidin-biotin assemblies on silanized glass.

Authors:  Li-Jung Chen; Jeong Hyun Seo; Michael J Eller; Stanislav V Verkhoturov; Sunny S Shah; Alexander Revzin; Emile A Schweikert
Journal:  Anal Chem       Date:  2011-08-29       Impact factor: 6.986

4.  Influence of the organic layer thickness in (metal-assisted) secondary ion mass spectrometry using Ga+ and C60+ projectiles.

Authors:  Nimer Wehbe; Taoufiq Mouhib; Aneesh Prabhakaran; Patrick Bertrand; Arnaud Delcorte
Journal:  J Am Soc Mass Spectrom       Date:  2009-09-03       Impact factor: 3.109

  4 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.