Literature DB >> 19045895

All low voltage lateral junction scanning tunneling microscope with very high precision and stability.

Yubin Hou1, Jihui Wang, Qingyou Lu.   

Abstract

We describe the first lateral junction and fully low voltage scanning tunneling microscope, featuring very high precision, stability, compactness, and image quality (highly oriented pyrolytic graphite atomic resolution images). In its core, the tip and sample each sit on one of two parallel-mounted piezoelectric tube scanners so that the tip-sample gap is regulated along the scanners' pairing direction. The scanner's large lateral deflection provides a large gap regulation range even under low voltages, allowing exclusively using only low voltage (less than +/-15 V) operational amplifiers to precisely implement the coarse (inertial slider) and fine approach, feedback control, and hence the entire electronics. Because the scanners are identical and adjacent, thermal drifts are minimal.

Year:  2008        PMID: 19045895     DOI: 10.1063/1.3005484

Source DB:  PubMed          Journal:  Rev Sci Instrum        ISSN: 0034-6748            Impact factor:   1.523


  2 in total

1.  The coefficient of the voltage induced frequency shift measurement on a quartz tuning fork.

Authors:  Yubin Hou; Qingyou Lu
Journal:  Sensors (Basel)       Date:  2014-11-19       Impact factor: 3.576

2.  A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled XY and Z Scans.

Authors:  Xu Chen; Tengfei Guo; Yubin Hou; Jing Zhang; Wenjie Meng; Qingyou Lu
Journal:  Scanning       Date:  2017-11-14       Impact factor: 1.932

  2 in total

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