| Literature DB >> 18963382 |
Abstract
The analytical use of particle- and photon-induced X-ray emission spectroscopy has become an important tool in trace element analysis, especially when only small amounts of sample material are available. The physical basis, experimental procedure and typical examples are reviewed.Year: 1983 PMID： 18963382 DOI： 10.1016/0039-9140(83)80093-9
Source DB: PubMed Journal: Talanta ISSN： 0039-9140 Impact factor: 6.057