| Literature DB >> 18851256 |
H W Jang1, S H Baek, D Ortiz, C M Folkman, R R Das, Y H Chu, P Shafer, J X Zhang, S Choudhury, V Vaithyanathan, Y B Chen, D A Felker, M D Biegalski, M S Rzchowski, X Q Pan, D G Schlom, L Q Chen, R Ramesh, C B Eom.
Abstract
Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant.Entities:
Year: 2008 PMID: 18851256 DOI: 10.1103/PhysRevLett.101.107602
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161