| Literature DB >> 18764210 |
Xiaosong Wu1, Mike Sprinkle, Xuebin Li, Fan Ming, Claire Berger, Walt A de Heer.
Abstract
Graphene-oxide (GO) flakes have been deposited to bridge the gap between two epitaxial-graphene electrodes to produce all-graphene devices. Electrical measurements indicate the presence of Schottky barriers at the graphene/graphene-oxide junctions, as a consequence of the band gap in GO. The barrier height is found to be about 0.7 eV, and is reduced after annealing at 180 degrees C, implying that the gap can be tuned by changing the degree of oxidation. A lower limit of the GO mobility was found to be 850 cm2/V s, rivaling silicon. In situ local oxidation of patterned epitaxial graphene has been achieved.Entities:
Year: 2008 PMID: 18764210 DOI: 10.1103/PhysRevLett.101.026801
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161