Literature DB >> 18726490

Mapping of a BYDV resistance gene from Thinopyrum intermedium in wheat background by molecular markers.

Z Zhang1, Z Xin, Y Ma, X Chen, Q Xu, Z Lin.   

Abstract

The wheat line H960642 is a homozygous wheat-Thinopyrum intermedium translocation line with resistance to BYDV by genomic in situ hybridization (GISH) and RFLP analysis. The genomic DNA of Th. intermedium was used as a probe, and common wheat genomic DNA as a blocking in GISH experiment. The results showed that the chromosome segments of Th. intermedium were transferred to the distal end of a pair of wheat chromosomes. RFLP analysis indicated that the translocation line H960642 is a T7DS-7DL-7XL translocation by using 8 probes mapped on the homoeologous group 7 in wheat. The translocation breakpoint is located between Xpsr680 and Xpsr965 about 90-99 cM from the centromere. The RFLP markers psr680 and psr687 were closely linked with the BYDV resistance gene. The gene is located on the distal end of 7XL around Xpsr680 and Xpsr687.

Entities:  

Year:  1999        PMID: 18726490     DOI: 10.1007/BF02881585

Source DB:  PubMed          Journal:  Sci China C Life Sci        ISSN: 1006-9305


  4 in total

1.  Wheat resistome in response to barley yellow dwarf virus infection.

Authors:  Xindong Wang; Yan Liu; Liang Chen; Dan Zhao; Xifeng Wang; Zengyan Zhang
Journal:  Funct Integr Genomics       Date:  2013-02-16       Impact factor: 3.410

2.  Mapping a resistance gene in wheat cultivar Yangfu 9311 to yellow mosaic virus, using microsatellite markers.

Authors:  Weihua Liu; Huan Nie; Shibo Wang; Xin Li; Zhentian He; Chenggui Han; Jinrong Wang; Xiulan Chen; Lihui Li; Jialin Yu
Journal:  Theor Appl Genet       Date:  2005-06-17       Impact factor: 5.699

3.  Molecular characterization of the genomic region harboring the BYDV-resistance gene Bdv2 in wheat.

Authors:  L Gao; Q Ma; Y Liu; Z Xin; Z Zhang
Journal:  J Appl Genet       Date:  2009       Impact factor: 3.240

4.  Overexpression of TiERF1 enhances resistance to sharp eyespot in transgenic wheat.

Authors:  Liang Chen; ZengYan Zhang; HongXia Liang; HongXia Liu; LiPu Du; Huijun Xu; Zhiyong Xin
Journal:  J Exp Bot       Date:  2008-10-26       Impact factor: 6.992

  4 in total

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