Literature DB >> 18672329

Analytic derivation of optimal imaging conditions for incoherent imaging in aberration-corrected electron microscopes.

Varat Intaraprasonk1, Huolin L Xin, David A Muller.   

Abstract

The optimal lens parameters for incoherent imaging using third and fifth-order aberration-corrected electron microscopes are derived analytically. We propose simple models for the point spread function (PSF) and transfer function that give analytic formulae for the lateral resolution and depth resolution. We also derive an analytic formula for the contrast transfer function (CTF) in three dimensions and show that depth sectioning has an information limit equivalent to tomography with a missing cone of 90 degrees minus the aperture angle.

Year:  2008        PMID: 18672329     DOI: 10.1016/j.ultramic.2008.05.013

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  4 in total

1.  An ultrabright and monochromatic electron point source made of a LaB6 nanowire.

Authors:  Han Zhang; Jie Tang; Jinshi Yuan; Yasushi Yamauchi; Taku T Suzuki; Norio Shinya; Kiyomi Nakajima; Lu-Chang Qin
Journal:  Nat Nanotechnol       Date:  2015-11-30       Impact factor: 39.213

Review 2.  Electron Tomography: A Three-Dimensional Analytic Tool for Hard and Soft Materials Research.

Authors:  Peter Ercius; Osama Alaidi; Matthew J Rames; Gang Ren
Journal:  Adv Mater       Date:  2015-06-18       Impact factor: 30.849

3.  Single-particle cryo-EM structures from iDPC-STEM at near-atomic resolution.

Authors:  Ivan Lazić; Maarten Wirix; Max Leo Leidl; Felix de Haas; Daniel Mann; Maximilian Beckers; Evgeniya V Pechnikova; Knut Müller-Caspary; Ricardo Egoavil; Eric G T Bosch; Carsten Sachse
Journal:  Nat Methods       Date:  2022-09-05       Impact factor: 47.990

4.  Aberration correction for low voltage optimized transmission electron microscopy.

Authors:  Jaromír Bačovský
Journal:  MethodsX       Date:  2018-08-25
  4 in total

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