Mark Freeman, Wayne Hiebert. Show Affiliations »
Abstract
Mesh: See more » Electrochemistry/instrumentationEquipment DesignEquipment Failure AnalysisInformation Storage and RetrievalMechanicsNanotechnology/instrumentationSignal Processing, Computer-Assisted/instrumentation
Year: 2008 PMID: 18654515 DOI: 10.1038/nnano.2008.121
Source DB: PubMed Journal: Nat Nanotechnol ISSN: 1748-3387 Impact factor: 39.213