| Literature DB >> 18643521 |
G H Enevoldsen1, T Glatzel, M C Christensen, J V Lauritsen, F Besenbacher.
Abstract
From an interplay of simultaneous Kelvin probe force microscopy and noncontact atomic force microscopy we study atomic-scale variations in the electronic surface potential on TiO(2)(110). Both imaging channels reveal an atomic contrast reflected by the geometry and charged state of the alternating rows of Ti and O surface atoms. From a thorough cross-section analysis we add significant trust to the concept of a local contact potential difference, and determine from this the chemical identity of individual surface species and their role in setting up the local surface potential.Entities:
Year: 2008 PMID: 18643521 DOI: 10.1103/PhysRevLett.100.236104
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161