| Literature DB >> 18576694 |
Sang Hyun Lee1, Tsutomu Minegishi, Jin Sub Park, Seung Hwan Park, Jun-Seok Ha, Hyo-Jong Lee, Hyun-Jae Lee, Sungmo Ahn, Jaehoon Kim, Heonsu Jeon, Takafumi Yao.
Abstract
Periodically polarity inverted (PPI) ZnO templates were fabricated using molecular beam epitaxy by employing MgO buffer layers. The polarity of ZnO film was controlled by the transformation of crystal structure from hexagonal to rocksalt due to the thickness of the MgO buffer layers. The polarity of ZnO in the PPI template was confirmed by AFM and PRM measurement. Higher growth rate and lower current value under positive supplied voltage in the region of Zn-polar were measured with comparing to that of O-polar. Holographic lithographic technique was employed for the realization of submicron pattern of periodical inverted polar ZnO over large area. After reaction using a carbothermal reduction, spatially well-separated ZnO nanorods with pitch of submicron were only observed in the Zn-polar regions. The possible reason for the difference of surface characteristics was considered as being due to the configuration of dangling bonds according to polarity.Entities:
Year: 2008 PMID: 18576694 DOI: 10.1021/nl801344s
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189