Literature DB >> 18545588

Broadband and omnidirectional antireflection employing disordered GaN nanopillars.

C H Chiu1, Peichen Yu, H C Kuo, C C Chen, T C Lu, S C Wang, S H Hsu, Y J Cheng, Y C Chang.   

Abstract

Disordered GaN nanopillars of three different heights: 300, 550, and 720 nm are fabricated, and demonstrate broad angular and spectral antireflective characteristics, up to an incident angle of 60? and for the wavelength range of lambda=300-1800 nm. An algorithm based on a rigorous coupled-wave analysis (RCWA) method is developed to investigate the correlations between the reflective characteristics and the structural properties of the nanopillars. The broadband and omnidirectional antireflection arises mainly from the refractive-index gradient provided by nanopillars. Calculations show excellent agreement with the measured reflectivities for both s- and p- polarizations.

Entities:  

Mesh:

Substances:

Year:  2008        PMID: 18545588     DOI: 10.1364/oe.16.008748

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  2 in total

1.  Lithography-Free Fabrication of Large Area Subwavelength Antireflection Structures Using Thermally Dewetted Pt/Pd Alloy Etch Mask.

Authors:  Youngjae Lee; Kisik Koh; Hyungjoo Na; Kwanoh Kim; Jeong-Jin Kang; Jongbaeg Kim
Journal:  Nanoscale Res Lett       Date:  2009-01-24       Impact factor: 4.703

Review 2.  Numerical Modeling of Sub-Wavelength Anti-Reflective Structures for Solar Module Applications.

Authors:  Katherine Han; Chih-Hung Chang
Journal:  Nanomaterials (Basel)       Date:  2014-01-29       Impact factor: 5.076

  2 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.