| Literature DB >> 18542434 |
H-G von Ribbeck1, M Brehm, D W van der Weide, S Winnerl, O Drachenko, M Helm, F Keilmann.
Abstract
We demonstrate a scattering-type scanning near-field optical microscope (s-SNOM) with broadband THz illumination. A cantilevered W tip is used in tapping AFM mode. The direct scattering spectrum is obtained and optimized by asynchronous optical sampling (ASOPS), while near-field scattering is observed by using a space-domain delay stage and harmonic demodulation of the detector signal. True near-field interaction is determined from the approach behavior of the tip to Au samples. Scattering spectra of differently doped Si are presented.Entities:
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Year: 2008 PMID: 18542434 DOI: 10.1364/oe.16.003430
Source DB: PubMed Journal: Opt Express ISSN: 1094-4087 Impact factor: 3.894