| Literature DB >> 18517965 |
A M Lindenberg1, S Engemann, K J Gaffney, K Sokolowski-Tinten, J Larsson, P B Hillyard, D A Reis, D M Fritz, J Arthur, R A Akre, M J George, A Deb, P H Bucksbaum, J Hajdu, D A Meyer, M Nicoul, C Blome, Th Tschentscher, A L Cavalieri, R W Falcone, S H Lee, R Pahl, J Rudati, P H Fuoss, A J Nelson, P Krejcik, D P Siddons, P Lorazo, J B Hastings.
Abstract
Femtosecond time-resolved small and wide angle x-ray diffuse scattering techniques are applied to investigate the ultrafast nucleation processes that occur during the ablation process in semiconducting materials. Following intense optical excitation, a transient liquid state of high compressibility characterized by large-amplitude density fluctuations is observed and the buildup of these fluctuations is measured in real time. Small-angle scattering measurements reveal snapshots of the spontaneous nucleation of nanoscale voids within a metastable liquid and support theoretical predictions of the ablation process.Year: 2008 PMID： 18517965 DOI： 10.1103/PhysRevLett.100.135502
Source DB: PubMed Journal: Phys Rev Lett ISSN： 0031-9007 Impact factor: 9.161