| Literature DB >> 18517894 |
Hiroyuki Matsui1, Tatsuo Hasegawa, Yoshinori Tokura, Maki Hiraoka, Toshikazu Yamada.
Abstract
Polaron states in organic thin-film transistors (TFTs) were investigated by the electron spin resonance (ESR) technique. Gate-field-dependent and temperature-dependent single-Lorentzian ESR spectra were observed for field-induced polarons in pentacene TFTs, demonstrating the effect of motional narrowing due to polaron diffusion. Analyses of the ESR linewidth revealed a considerably long trapping time (tau_(C) approximately 0.7 ns), the variation of which is discussed in terms of the multiple trap-and-release model.Entities:
Year: 2008 PMID: 18517894 DOI: 10.1103/PhysRevLett.100.126601
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161