| Literature DB >> 18517883 |
J Hass1, F Varchon, J E Millán-Otoya, M Sprinkle, N Sharma, W A de Heer, C Berger, P N First, L Magaud, E H Conrad.
Abstract
We show experimentally that multilayer graphene grown on the carbon terminated SiC(0001[over ]) surface contains rotational stacking faults related to the epitaxial condition at the graphene-SiC interface. Via first-principles calculation, we demonstrate that such faults produce an electronic structure indistinguishable from an isolated single graphene sheet in the vicinity of the Dirac point. This explains prior experimental results that showed single-layer electronic properties, even for epitaxial graphene films tens of layers thick.Entities:
Year: 2008 PMID: 18517883 DOI: 10.1103/PhysRevLett.100.125504
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161