Literature DB >> 18449230

Laser damage resistance of hafnia thin films deposited by electron beam deposition, reactive low voltage ion plating, and dual ion beam sputtering.

Laurent Gallais1, Jérémie Capoulade, Jean-Yves Natoli, Mireille Commandré, Michel Cathelinaud, Cian Koc, Michel Lequime.   

Abstract

A comparative study is made of the laser damage resistance of hafnia coatings deposited on fused silica substrates with different technologies: electron beam deposition (from Hf or HfO(2) starting material), reactive low voltage ion plating, and dual ion beam sputtering. The laser damage thresholds of these coatings are determined at 1064 and 355 nm using a nanosecond pulsed YAG laser and a one-on-one test procedure. The results are associated with a complete characterization of the samples: refractive index n measured by spectrophotometry, extinction coefficient k measured by photothermal deflection, and roughness measured by atomic force microscopy.

Entities:  

Year:  2008        PMID: 18449230     DOI: 10.1364/ao.47.00c107

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  1 in total

1.  Temperature-Dependent HfO2/Si Interface Structural Evolution and its Mechanism.

Authors:  Xiao-Ying Zhang; Chia-Hsun Hsu; Shui-Yang Lien; Wan-Yu Wu; Sin-Liang Ou; Song-Yan Chen; Wei Huang; Wen-Zhang Zhu; Fei-Bing Xiong; Sam Zhang
Journal:  Nanoscale Res Lett       Date:  2019-03-07       Impact factor: 4.703

  1 in total

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