Literature DB >> 18406532

Novel carbon nanosheets as support for ultrahigh-resolution structural analysis of nanoparticles.

Christoph T Nottbohm1, Andre Beyer, Alla S Sologubenko, Inga Ennen, Andreas Hütten, Harald Rösner, Wolfgang Eck, Joachim Mayer, Armin Gölzhäuser.   

Abstract

The resolution in transmission electron microscopy (TEM) has reached values as low as 0.08 nm. However, these values are not accessible for very small objects in the size range of a few nanometers or lower, as they have to be placed on some support, which contributes to the overall electron-scattering signal, thereby blurring the contrast. Here, we report on the use of nanosheets made from cross-linked aromatic self-assembled monolayers as TEM sample supports. When transferred onto a copper grid, a single 1.6-nm-thick nanosheet can cover the grid and is free standing within the micron-sized openings. Despite its thinness, the sheet is stable under the impact of the electron beam. Micrographs taken from nanoclusters onto these nanosheets show highly increased contrast in comparison to the images taken from amorphous carbon supports. In scanning transmission electron microscopy with nanosheet support, a size analysis of sub-nanometer Au clusters was performed and single Au atoms were resolved.

Entities:  

Year:  2008        PMID: 18406532     DOI: 10.1016/j.ultramic.2008.02.008

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  4 in total

1.  Investigation of electron-induced cross-linking of self-assembled monolayers by scanning tunneling microscopy.

Authors:  Patrick Stohmann; Sascha Koch; Yang Yang; Christopher David Kaiser; Julian Ehrens; Jürgen Schnack; Niklas Biere; Dario Anselmetti; Armin Gölzhäuser; Xianghui Zhang
Journal:  Beilstein J Nanotechnol       Date:  2022-05-25       Impact factor: 3.272

2.  Mechanical characterization of carbon nanomembranes from self-assembled monolayers.

Authors:  Xianghui Zhang; André Beyer; Armin Gölzhäuser
Journal:  Beilstein J Nanotechnol       Date:  2011-12-20       Impact factor: 3.649

3.  Imaging of carbon nanomembranes with helium ion microscopy.

Authors:  André Beyer; Henning Vieker; Robin Klett; Hanno Meyer Zu Theenhausen; Polina Angelova; Armin Gölzhäuser
Journal:  Beilstein J Nanotechnol       Date:  2015-08-12       Impact factor: 3.649

4.  Fabrication of carbon nanomembranes by helium ion beam lithography.

Authors:  Xianghui Zhang; Henning Vieker; André Beyer; Armin Gölzhäuser
Journal:  Beilstein J Nanotechnol       Date:  2014-02-21       Impact factor: 3.649

  4 in total

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