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Applied physics. At mixed odds, racetrack memory charges from gate.

Abstract

Source DB: PubMed Journal: Science ISSN： 0036-8075 Impact factor: 47.728

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Authors: Ziyang Yu; Bin Gong; Lun Xiong; Xinran Du; Chenhuinan Wei; Rui Xiong; Zhihong Lu; Yue Zhang
Journal: Nanoscale Adv Date: 2022-02-03

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