| Literature DB >> 18350049 |
Abstract
Temporal and spatial phase shifting in electronic speckle-pattern interferometry are compared quantitatively with respect to the quality of the resultant deformation phase maps. On the basis of an analysis of the noise in sawtooth fringes a figure of merit is defined and measured for various in-plane and out-of-plane sensitive electronic speckle-pattern interferometry configurations. Varying quantities like the object-illuminating intensity, the beam ratio, the speckle size and shape, and the fringe density allows characteristic behaviors of both phase-shifting methods to be explored.Year: 2000 PMID: 18350049 DOI: 10.1364/ao.39.004598
Source DB: PubMed Journal: Appl Opt ISSN: 1559-128X Impact factor: 1.980